• Non-ambient attachment for X-ray diffraction studies from -190 °C to 600 °C
• For investigations on samples in reflection and transmission geometry
• Also for air-sensitive samples and in-operando studies on batteries
• Fits to all common powder diffractometers
The TTK 600 Low-Temperature Chamber is a non-ambient attachment for powder X-ray diffraction studies from -190°C to 600°C. Different sample holders allow investigating samples in reflection and transmission geometry. Samples can be measured in vacuum, air or inert gases. An antechamber option allows safe transfer of air-sensitive samples into the TTK 600.
The TTK 600 fits to all common powder diffractometers and is the instrument of choice for X-ray structure analysis of various sample types at low and medium temperatures.
Fast and accurate temperature control
• Liquid nitrogen cooling to -190°C or compressed air cooling to -10°C
• Resistance heating for rapid heating up to 600°C
Pt100 close to the sample for precise temperature measurement
• Flexible liquid nitrogen hoses for movability even at -190°C
• Improved heat transfer from heater to sample holder. Additional convection heating for the capillary sample holder and the transmission sample holder for reduced temperature deviation
Optimized for maximum sample flexibility
• Various types of sample holders:
• Standard sample holder for the investigation of powders in reflection geometry (different depths available)
• Capillary sample holder for the investigation of powders in transmission geometry
• Transmission sample holder for the investigation of foils, pastes and powders in transmission mode
• Zero background holder for transparent samples
Integrated beam knife to minimize background at low 2θ
• Easy exchange and mounting of samples
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| Model | TTK 600 |
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| Operating temperature | -190 °C to 600 °C with liquid nitrogen cooling |
| | -10 °C to 600 °C with compressed-air cooling |
| Temperature measurement | Pt 100 |
| Atmosphere | Vacuum (10-2 mbar), air, inert gas |
| Angle of incidence (2Θ) | 0 to 164 ° (standard sample holder) |
| Max. operating pressure | 2 bar above atmospheric pressure |
| Sample holder material | Chromium-plated copper |
| Sample size | 14 x 10 mm |
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Платформи для рентгенівської дифракції.pdf
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