The TS 600 Tensile Stage is a completely new, advanced sample stage for in-situ X-ray diffraction studies of stress/strain phenomena in fibers, foils and thin films. It is the first commercial sample stage specifically designed for in-situ XRD investigations of structural changes in materials under mechanical load. Because of its compactness and low weight, the instrument can be used on synchotrons as well as on laboratory X-ray diffractometers. And what’s more, it can be operated in transmission and reflection mode to gain new insights into the world of strain and stress.
Exploring the world of mechanical properties
Simultaneous straining and X-ray diffraction
Two different load cells cover a large force range with high resolution
Easy exchange and automatic recognition of load cells
Precise measurement of force and sample elongation
Compact and versatile
Measurements in transmission and reflection geometry
Various sample types, such as fibers, foils, thin sheets, etc
Suitable for synchotrons and commercial X-ray diffractometers
Small size and low weight
Easy access to complex information
User-friendly control and data acquisition software
Programming of complex load profiles possible including cyclic straining and creep experiments
Data can be viewed online in different representations and exported in various formats
| Model | TS 600 |
| Force range | 5 N load cell: 0.05 to 5 N |
| | 600 N load cell: 1 to 600 N |
| Speed range | 0.05 to 5 mm/min |
| Angular range | Ψ ≤ 20° to 90° (depending on Φ) |
| | Θ ≤ 20° to 90° (depending on Φ) |
| | Φ 0° to ± 180° |
| Sample size | Length: min. 30 mm |
| | Width: max. 15 mm |
| | Thickness: max. 2 mm |
| Diameter | 155 mm |
| Total height | 48.5 mm |
| Height of sample above base plate | 36 mm |
| Weight | 1.3 kg |
| X-ray geometry | Transmission and reflection |
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Платформи для рентгенівської дифракції.pdf
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