• Versatile software package for powder diffraction analysis
• Search/match feature for rapid and accurate phase identification
• Rietveld analysis using matched or manually loaded phases
• Optimized analysis workflows including batch analysis to speed up and simplify your analytical tasks
XRDanalysis is a next-generation software package for the analysis of powder diffraction data on Anton Paar’s XRDynamic 500. It allows you to effortlessly perform profile fitting, phase identification or quantification, and microstructure analysis on data collected under both ambient and non-ambient conditions. XRDanalysis features optimized analysis workflows for different tasks to assist users new to XRD, while retaining the flexibility demanded by more advanced users.
Automate your analysis by integrating multiple analysis tasks in a single workflow
Perform analysis of powder diffraction data the way you want with a flexible workflow concept that allows multiple tasks to be combined and executed with a single click. From peak search, profile fitting, phase identification, all the way through to Rietveld analysis, all steps can be combined in a single workflow to automate your analysis tasks. For evaluation of multiple data sets, batch processing can also be easily performed, even with different workflows for different data sets, if desired. This makes XRDanalysis extremely easy to be learnt and used by less experienced users, while still giving expert users the flexibility they require.
Advanced phase identification to never miss a phase
The search/match algorithms used in XRDanalysis allow phase identification via searching in reference databases such as the PDF databases from the ICDD. An advanced residual search is performed once phases have been added, ensuring that even the most minor phase fractions can be identified. Moreover, the residual search also works when phases have been loaded manually (e.g. from a CIF) so you do not need to rely only on reference databases during phase identification.
Accurate phase quantification even for minor phases
The Rietveld refinement option in XRDanalysis allows you to perform quantitative phase and structural analysis while accounting for all instrument and sample microstructural effects. Rietveld analysis can be performed on any phase where atomic positions are available. Phases can be either directly carried over from reference database match results or manually added from CIFs; combinations of phases from both sources are also possible. The refined phase parameters not only deliver the phase fractions, but also microstructural parameters such as crystallite size and strain.
Customizable reporting
XRDanalysis makes it possible to quickly and easily export data and graphics from every analysis step in a format of your choice. Including an optimized interface with Microsoft Office packages, the reporting and data export feature allows optimal preparation of data and graphics for publication or for further analysis outside of the XRDanalysis platform.
| Model | XRDanalysis |
| System requirements | Intel™ i5, 2.67 GHz or higher |
| | 16 GB RAM (depending on the operating system) |
| | 1.5 GB free disk space |
| Supported operating systems | Microsoft Windows™ 8, 10; 64-bit |
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