Domed Hot Stage for Four-Circle Goniometers
• For in-situ high-temperature studies on almost all common four-circle goniometers and many XYZ stages
• Temperature range from 25 °C to 1100 °C
• For investigating phase transformations, texture, and internal stress in crystalline materials
DHS 1100 is a heating attachment which is a further development of the well-established DHS 900 Domed Hot Stage. It has an increased temperature range of 25 to 1100°C. DHS 1100 is small and lightweight and can be mounted on almost all common four-circle goniometers and many XYZ stages. Under its innovative graphite dome, samples can be measured in vacuum, air and various other gases. DHS 1100 is an excellent sample stage for in-situ high-temperature studies of phase transformations, texture, and internal stress in crystalline materials.
Unique X-ray window
Highly X-ray transparent graphite dome
Sample area with vacuum tightness better than 1x10-2 mbar for investigating oxygen-sensitive samples
No parts of the instrument above the sample which would block the X-ray beam
Excellent heating with few side effects
Fast and stable sample heating up to 1100 °C
Excellent temperature homogeneity across the heating plate
Accurate measurement of the sample temperature
Minimum sample tilt and expansion of the sample holder
Chemically resistant ceramics heating plate
Compact and mobile
Very low weight - less than 500 g
Outer diameter only 130 mm
Sophisticated air-cooling system
Only two highly flexible supply hoses, providing exceptional mobility on the goniometer
Fits on most Eulerian cradles and many XYZ stages
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Model | DHS 1100 |
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Operating temperature | 25 °C to 1100 °C |
Temperature measurement | Pt-10% Rh-Pt thermocouple |
Atmospheres | Vacuum (10 -1 mbar), air, inert gas,nitrogen |
Max. operating pressure | max. 0.3 bar above atmospheric pressure |
Possible scattering angle | 0 to 166° 2Θ |
| 0 to 85° Psi |
| 0 to 360° Phi |
Sample holder material | Aluminium nitride |
Sample diameter | max. 25 mm |
Dome Material | Graphite |
Transmission (incident and diffracted rays) | CuKα: 65% |
Measure geometry | Reflection |
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Платформи для рентгенівської дифракції.pdf
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