Atomic force microscopy (AFM)

This review article presents accessible scientific information about the capabilities of atomic force and scanning probe microscopy. Article describes the characteristic features of atomic force microscopy techniques that help to obtain additional information about sample properties and different modes: the phase image, the Kelvin probe method, and the force-volume curves. One can find here principles of the atomic force and scanning tunneling microscope and examples of the various techniques implementation for the study of various microscopic objects. Microscopically examination of the material can give information not only about surface topography, but also about chemical composition of surface, and mechanical and physical properties of the surface under various conditions. This article is for a wide range of specialists, for materials scientists and for scientific workers.
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