Scratch Testers

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Scratch Testers

Description

Scratch testers from Anton Paar are used to characterize film-substrate systems and to quantify parameters such as adhesive strength and friction force by using a variety of complementary methods. This makes them invaluable tools for the determination of coating adhesion, scratch resistance, and mar resistance in research, development, and quality control.

Access to unique and patented synchronized panorama
Anton Paar is the unique holder of the patents US 8261600 and EP 2065695. The scratch tester’s panorama mode is the most important feature of the software. After the scratch, you have the option of recording the full panorama. When your panorama is recorded, you can re-analyze your results at any time.

More insights into true penetration depth for elastic recovery studies
The displacement sensor Dz monitors the surface profile of your sample before, during and after a scratch. This means you can evaluate the penetration depth of the indenter during and after the scratch, for even more reliable insights into scratch and mar resistance.

Accurate force control even on complex surfaces
The system’s active force feedback ensures reproducible scratch testing, even when you investigate more complex surface geometries like non-parallel, rough or curved samples. Anton Paar’s testers are the only commercially available systems that have active force feedback.

A platform to suit your needs and budget
The modular platform portfolio provides the ideal instrument for each budget and force range (dedicated instrument for the micro, nano, and ultra nano range). A highlight is the high-quality but affordable mechanical surface testing platform for the micro range which is specially designed for high-throughput and fast measurements.

Save time changing between high-quality objectives
The scratch testers’ integrated microscope consists of a turret with high-quality Olympus objectives and a USB video camera rather than a single-objective microscope of lesser quality. It is easy to change magnifications for imaging, which saves you time and ensures smooth testing of a number of different samples in one series.

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